MN

Masayuki Nara

MI Mitutoyo: 18 patents #34 of 721Top 5%
Overall (All Time): #244,917 of 4,157,543Top 6%
18
Patents All Time

Issued Patents All Time

Showing 1–18 of 18 patents

Patent #TitleCo-InventorsDate
12241737 Three-dimensional-measuring-apparatus inspection gauges, three-dimensional-measuring-apparatus inspection methods and three-dimensional measuring apparatuses Yuto Inoue 2025-03-04
11867809 Measurement apparatus and measurement method Yoshimasa Suzuki, Shinichi Hara, Shinji Komatsuzaki, Ryusuke Kato, Hiroki Ujihara +1 more 2024-01-09
11656074 Calibration method Yuto Inoue 2023-05-23
11530908 Measurement point determination method, non-transitory storage medium, and measurement point determination apparatus Takeshi Hagino, Yuto Inoue 2022-12-20
11525664 Calibration method 2022-12-13
11366447 Spatial accuracy correction method and apparatus Shinichiro Yanaka 2022-06-21
11366448 Spatial accuracy correction method and apparatus Shinichiro Yanaka 2022-06-21
11359910 Inspection method, correction method, and inspection device 2022-06-14
10557941 Method and apparatus for inspecting positioning machine by laser tracking interferometer Shinichirou Yanaka 2020-02-11
9335186 Index error estimating apparatus, index error calibrating apparatus, and index error estimating method 2016-05-10
9316487 Laser tracking interferometer Shinichiro Yanaka 2016-04-19
8514405 Tracking type laser gauge interferometer with rotation mechanism correction 2013-08-20
8175743 Measurement system and interferometer 2012-05-08
7765079 Two-dimensional lattice calibrating device, two-dimensional lattice calibrating method, two-dimensional lattice calibrating program and recording medium Makoto Abbe 2010-07-27
7583374 Measurement method and measurement apparatus using tracking type laser interferometer 2009-09-01
7483807 Form measuring device, form measuring method, form analysis device, form analysis program, and recording medium storing the program Makoto Abbe 2009-01-27
7225104 Method and program for estimating uncertainty Makoto Abbe 2007-05-29
7188046 Form measuring device, form measuring method, form analysis device, form analysis program, and recording medium storing the program Makoto Abbe 2007-03-06