LK

Lukas Kral

FE Fei: 2 patents #250 of 681Top 40%
Overall (All Time): #1,876,856 of 4,157,543Top 50%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10998166 System and method for beam position visualization Branislav Straka, Radek Smolka, Jan Skalicky 2021-05-04
10763079 Focused ion beam impurity identification Jeremy Graham 2020-09-01