| 12355430 |
High-power product switch protection system and high power product switch protection method |
— |
2025-07-08 |
| 11953518 |
Switching matrix system and operating method thereof for semiconductor characteristic measurement |
Choon Leong Lou, Hsiao Hui Hsieh |
2024-04-09 |
| 11209462 |
Testing apparatus |
Choon Leong Lou, Hsiao Ting Tseng, Chia Hao Tu, Chun-Wei Peng |
2021-12-28 |
| D845197 |
Clutch pressure plate cover |
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2019-04-09 |
| 10184957 |
Testing apparatus, holding assembly, and probe card carrier |
Choon Leong Lou, Ho Yeh Chen, Hsiao Ting Tseng |
2019-01-22 |
| 9885746 |
Switching matrix and testing system for semiconductor characteristic measurement using the same |
Choon Leong Lou |
2018-02-06 |
| 9873133 |
Extrusion device and coating system |
Yi-Ming Hsu, Yen-Ling Liu, Chien-Cheng Wang, Wen-Hsiao Shen |
2018-01-23 |
| 9739830 |
Test assembly |
Choon Leong Lou, Hsiao Ting Tseng, Ho Yeh Chen |
2017-08-22 |
| 9474141 |
Arc atmospheric pressure plasma device |
Chau-Nan Hong, Yi-Ming Hsu |
2016-10-18 |
| 9320125 |
Plasma device |
Yi-Ming Hsu, An Li |
2016-04-19 |
| 8389926 |
Testing apparatus for light-emitting devices with a design for a removable sensing module |
Choon Leong Lou, Yi Ming Lau, Ho Yeh Chen |
2013-03-05 |
| 7675307 |
Heating apparatus for semiconductor devices |
Choon Leong Lou, Yi Ming Lau, Ho Yeh Chen |
2010-03-09 |
| 7616018 |
Integrated circuit probing apparatus having a temperature-adjusting mechanism |
Choon Leong Lou |
2009-11-10 |
| 7576553 |
Integrated circuit probing apparatus having a temperature-adjusting mechanism |
Choon Leong Lou |
2009-08-18 |