Issued Patents All Time
Showing 25 most recent of 48 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12405290 | Probe testing device having elastic structure | — | 2025-09-02 |
| 12345759 | Guide plate structure having guide plates with through holes and probe array having guide plate structure | — | 2025-07-01 |
| 12255113 | Alignment method and alignment device | — | 2025-03-18 |
| 12210037 | Probe array and probe structure | — | 2025-01-28 |
| 12163980 | Probe and elastic structure thereof | — | 2024-12-10 |
| 12117484 | Test device | — | 2024-10-15 |
| 12111505 | Light guiding device and light guiding device applied to silicon photonics structure | — | 2024-10-08 |
| 11965912 | Probe card device having a probe structure with a protrusion portion | — | 2024-04-23 |
| 11953518 | Switching matrix system and operating method thereof for semiconductor characteristic measurement | Hsiao Hui Hsieh, Li Min Wang | 2024-04-09 |
| 11879913 | Probe card structure | — | 2024-01-23 |
| 11828789 | Test apparatus and jumper thereof | Yi Ming Lau | 2023-11-28 |
| 11804417 | Semiconductor structure comprising heat dissipation member | — | 2023-10-31 |
| 11768223 | Testing device and probe elements thereof | — | 2023-09-26 |
| 11761984 | Probe card device and testing equipment thereof | — | 2023-09-19 |
| 11754619 | Probing apparatus with temperature-adjusting mechanism | Chen-Wen Pan, Jung-Chieh Liu | 2023-09-12 |
| 11567104 | High speed signal transmitting and receiving detection device | — | 2023-01-31 |
| 11549968 | Probing system | — | 2023-01-10 |
| 11307246 | Probing apparatus and method of operating the same | Yi Ming Lau | 2022-04-19 |
| 11293975 | Probing device | — | 2022-04-05 |
| 11262400 | Shielding for probing system | — | 2022-03-01 |
| 11217649 | Method of testing and analyzing display panel | — | 2022-01-04 |
| 11209462 | Testing apparatus | Hsiao Ting Tseng, Li Min Wang, Chia Hao Tu, Chun-Wei Peng | 2021-12-28 |
| 11054465 | Method of operating a probing apparatus | Yi Ming Lau | 2021-07-06 |
| 11047880 | Probing device | Ho Yeh Chen | 2021-06-29 |
| 10890614 | Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under test | Yi Ming Lau | 2021-01-12 |