Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7870452 | Scan testing methods | Didier Gayraud | 2011-01-11 |
| 7688103 | Cell with fixed output voltage for integrated circuit | Patrick Da Silva | 2010-03-30 |
| 7459928 | Cell with fixed output voltage for integrated circuit | Patrick Da Silva | 2008-12-02 |
| 6970815 | Method of discriminating between different types of scan failures, computer readable code to cause a display to graphically depict one or more simulated scan output data sets versus time and a computer implemented circuit simulation and fault detection system | Jerome Bombal | 2005-11-29 |
| 6671870 | Computer implemented circuit synthesis system | Jerome Bombal, Bernard Ginetti | 2003-12-30 |
| 6311318 | Design for test area optimization algorithm | Jerome Bombal, Bernard Ginetti | 2001-10-30 |
| 6141782 | Pseudo-scan testing using hardware-accessible IC structures | Jerome Bombal | 2000-10-31 |
| 5960052 | Low power scannable counter | Jerome Bombal | 1999-09-28 |
| 5783874 | Keypad handling circuits | Philippe Gaglione, John Whittle | 1998-07-21 |