Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7203803 | Overflow protected first-in first-out architecture | — | 2007-04-10 |
| 6970815 | Method of discriminating between different types of scan failures, computer readable code to cause a display to graphically depict one or more simulated scan output data sets versus time and a computer implemented circuit simulation and fault detection system | Laurent Souef | 2005-11-29 |
| 6671870 | Computer implemented circuit synthesis system | Laurent Souef, Bernard Ginetti | 2003-12-30 |
| 6311318 | Design for test area optimization algorithm | Laurent Souef, Bernard Ginetti | 2001-10-30 |
| 6141782 | Pseudo-scan testing using hardware-accessible IC structures | Laurent Souef | 2000-10-31 |
| 5960052 | Low power scannable counter | Laurent Souef | 1999-09-28 |