Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5854674 | Method of high speed, high detection sensitivity inspection of repetitive and random specimen patterns | — | 1998-12-29 |
| 5428442 | Inspection system with in-lens, off-axis illuminator | Victor A. Scheff | 1995-06-27 |
| 5172000 | Spatial filter for optically based defect inspection system | Victor A. Scheff, Robert B. Howe | 1992-12-15 |
| RE33956 | Inspection system for array of microcircuit dies having redundant circuit patterns | Daniel L. Cavan, Robert B. Howe | 1992-06-09 |
| 4806774 | Inspection system for array of microcircuit dies having redundant circuit patterns | Daniel L. Cavan, Robert B. Howe | 1989-02-21 |
| 4712851 | Positioning alignment apparatus and method using holographic optical elements | Richard L. Fusek | 1987-12-15 |