Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12429440 | Wafer measurement system using time-of-flight medium-energy ion scattering signal | Yu-Chiang Pao, Yao-Yu Chang, Yuh-Yih Lu, Soo-Bang Kim | 2025-09-30 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12429440 | Wafer measurement system using time-of-flight medium-energy ion scattering signal | Yu-Chiang Pao, Yao-Yu Chang, Yuh-Yih Lu, Soo-Bang Kim | 2025-09-30 |