KI

Kunio Iba

Fujitsu Limited: 2 patents #10,930 of 24,456Top 45%
KS Kobe Steel: 1 patents #937 of 1,773Top 55%
KI Kobelco Research Institute: 1 patents #37 of 79Top 50%
OE Omron Tateisi Electronics: 1 patents #264 of 599Top 45%
Overall (All Time): #998,711 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
9354047 Rotational misalignment measuring device of bonded substrate, rotational misalignment measuring method of bonded substrate, and method of manufacturing bonded substrate Masato Kannaka, Masakazu Kajita, Eiji Takahashi, Yuji Yamamoto, Masaru Akamatsu +1 more 2016-05-31
5095368 Defect-collecting image input apparatus with image sensor Tadashi Miyakawa 1992-03-10
5081414 Method for measuring lifetime of semiconductor material and apparatus therefor Tateo Kusama 1992-01-14
4974098 Original table for reading images Tadashi Miyakawa, Masahiro Inoda 1990-11-27
4690553 Road surface condition detection system Hiroshi Fukamizu, Masaji Nakano, Taro Yamasaki, Kenji Sano 1987-09-01