Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6693437 | Method and apparatus for identifying state-dependent, defect-related leakage currents in memory circuits | — | 2004-02-17 |
| 6330697 | Apparatus and method for performing a defect leakage screen test for memory devices | Michael Patrick Clinton, Russell J. Houghton, Alan D. Norris, Josef Schnell | 2001-12-11 |