Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12368065 | Wafer processing apparatus | Seungbeom Park, Seunghwa Hyun, Taejoong Kim, Youngkyu Park | 2025-07-22 |
| 12111270 | Method of inspecting a wafer and apparatus for performing the same | Juntaek Oh, Jinwoo Ahn, Youngkyu Park, Eunsoo Hwang | 2024-10-08 |
| 11668558 | Thickness estimation method and processing control method | Jongsu Kim, Wansung Park, Doohyun Cho, Sungha Kim, Jaeyoun Wi +4 more | 2023-06-06 |