Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8547547 | Optical surface defect inspection apparatus and optical surface defect inspection method | Shintaro Tamura, Masanori Fukawa, Ayumu Ishihara, Hiroshi Nakajima | 2013-10-01 |
| 8502966 | Surface defect inspection method and apparatus | Hiroshi Nakajima | 2013-08-06 |
| 8488116 | Surface defect inspection method and apparatus | Hiroshi Nakajima | 2013-07-16 |
| 8457926 | Disk protrusion detection/flatness measurement circuit and disk glide tester | Yasuhiro Tokumaru | 2013-06-04 |
| 8295000 | Method and its apparatus for inspecting a magnetic disk | Ayumu Ishihara | 2012-10-23 |
| 8294888 | Surface defect inspection method and apparatus | Hiroshi Nakajima | 2012-10-23 |
| 8089714 | Deterioration detection method of composite magnetic head and magnetic disk inspection apparatus | Takao Ishii | 2012-01-03 |
| 8031421 | Method for measuring optimum seeking time and inspection apparatus using the same | Sumihiro MAEDA | 2011-10-04 |
| 7929232 | Test method of a magnetic disk and magnectic disk tester | Haruyoshi Kato | 2011-04-19 |
| 7035039 | Magnetic head positioning control device, magnetic head certifier, magnetic disk certifier and head cartridge | Akihiro Matsumoto | 2006-04-25 |
| 6552535 | Defect detector circuit with a signal synthesizer and magnet disk certifier using the same defect detector circuit | Toshiharu Funaki, Shinji Honma, Hideki Mochiduki | 2003-04-22 |
| 6473258 | Magnetic disk read/write circuit having core coils of opposite phase | Kazuo Honma | 2002-10-29 |