Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9791849 | Defect detection process in a semiconductor manufacturing environment | David F. Cutilli, Matthew J. Hartnett, Glenn M. Stefanski | 2017-10-17 |
KR
Keith A. Robishaw
Overall (All Time): #2,969,997 of 4,157,543Top 75%
1
Patents All Time