Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9791849 | Defect detection process in a semiconductor manufacturing environment | David F. Cutilli, Matthew J. Hartnett, Keith A. Robishaw | 2017-10-17 |
| 8749388 | System and method for safeguarding wafers and photomasks | Paul D. Hand, George M. Harmuth, Gary T. Leonardi, Andrew P. Wyskida | 2014-06-10 |
| 8299926 | System and method for safeguarding wafers and photomasks | Paul D. Hand, George M. Harmuth, Gary T. Leonardi, Andrew P. Wyskida | 2012-10-30 |