Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7375570 | High-speed TDF testing on low cost testers using on-chip pulse generators and dual ATE references for rapidchip and ASIC devices | Doug Feist | 2008-05-20 |
| 7272763 | Built-in self test circuitry for process monitor circuit for rapidchip and ASIC devices | Anita Greeb | 2007-09-18 |
| 7240264 | Scan test expansion module | Douglas J. Feist | 2007-07-03 |
| 7216279 | Testing with high speed pulse generator | Anita Ekren | 2007-05-08 |
| 7202656 | Methods and structure for improved high-speed TDF testing using on-chip PLL | Douglas J. Feist | 2007-04-10 |
| 7152012 | Four point measurement technique for programmable impedance drivers RapidChip and ASIC devices | — | 2006-12-19 |
| 7106074 | Technique for measurement of programmable termination resistor networks on rapidchip and ASIC devices | Anita Greeb, Doug Feist | 2006-09-12 |
| 7081841 | Analog to digital converter built in self test | Douglas J. Feist, Scott Savage | 2006-07-25 |
| 7042242 | Built-in self test technique for programmable impedance drivers for RapidChip and ASIC drivers | — | 2006-05-09 |
| 6408265 | Metastability risk simulation analysis tool and method | Richard T. Schultz | 2002-06-18 |
| 6216254 | Integrated circuit design using a frequency synthesizer that automatically ensures testability | Michael Schleif Pesce, Jonathan P. Kuppinger | 2001-04-10 |
| 5701309 | Automated test equipment digital tester expansion apparatus | Darrell L. Pruehsner | 1997-12-23 |