Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11340026 | Heat storage sheet | Yuko Koseki | 2022-05-24 |
| 10968379 | Heat-storage composition | Yuko Koseki, Junichirou Koike, Kyouichi Toyomura | 2021-04-06 |
| 10619942 | Heat storage molded body, heat storage laminate, and heat storage molded body production method | Yuko Koseki | 2020-04-14 |
| 10502499 | Heat storage molded body, heat storage laminate, and heat storage molded body production method | Yuko Koseki | 2019-12-10 |
| 8677197 | Test apparatus | — | 2014-03-18 |
| 8325547 | Test apparatus and repair analysis method | — | 2012-12-04 |
| 8261139 | Clear instruction information to indicate whether memory test failure information is valid | — | 2012-09-04 |
| 7636877 | Test apparatus having a pattern memory and test method for testing a device under test | — | 2009-12-22 |
| 7529989 | Testing apparatus and testing method | — | 2009-05-05 |
| 7337381 | Memory tester having defect analysis memory with two storage sections | — | 2008-02-26 |
| 6173238 | Memory testing apparatus | — | 2001-01-09 |
| 6115833 | Semiconductor memory testing apparatus | Shinya Sato | 2000-09-05 |
| 6032281 | Test pattern generator for memories having a block write function | — | 2000-02-29 |
| 6006349 | High speed pattern generating method and high speed pattern generator using the method | — | 1999-12-21 |
| 5940875 | Address pattern generator for burst address access of an SDRAM | Toru Inagaki | 1999-08-17 |
| 5856985 | Test pattern generator | — | 1999-01-05 |
| 5852618 | Multiple bit test pattern generator | — | 1998-12-22 |
| 5835969 | Address test pattern generator for burst transfer operation of a SDRAM | Toru Inagaki | 1998-11-10 |
| 5831989 | Memory testing apparatus | — | 1998-11-03 |
| 5734660 | Scan test circuit for use in semiconductor integrated circuit | — | 1998-03-31 |
| 5481671 | Memory testing device for multiported DRAMs | — | 1996-01-02 |
| 5410687 | Analyzing device for saving semiconductor memory failures | Noboru Okino | 1995-04-25 |
| 4958345 | Memory testing device | — | 1990-09-18 |
| 4958346 | Memory testing device | — | 1990-09-18 |