Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5081354 | Method of determining the position of electron beam irradiation and device used in such method | Toshiyuki Ohhashi, Hiroyuki Kobayashi | 1992-01-14 |
| 4945237 | Transmission electron microscope | Toshiyuki Ohashi, Hiroyuki Kobayashi | 1990-07-31 |
| 4494000 | Image distortion-free, image rotation-free electron microscope | Hiroyuki Kobayashi, Morioki Kubozoe, Shigeto Isakozawa | 1985-01-15 |
| 4379231 | Electron microscope | Toshiyuki Ohashi | 1983-04-05 |
| 4283627 | Electron microscope | Shigeto Isakozawa | 1981-08-11 |