Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8054101 | Current source applicable to a controllable delay line and design method thereof | Chi Chen | 2011-11-08 |
| 7945404 | Clock jitter measurement circuit and integrated circuit having the same | Sheng-Bin Lin, Yeong-Jar Chang | 2011-05-17 |
| 7319625 | Built-in memory current test circuit | Yeong-Jar Chang, Kun Luo, Cheng-Wen Wu, Chin-Jung Su | 2008-01-15 |
| 6950046 | IC with built-in self-test and design method thereof | Pei-Wen Luo, Yeong-Jar Chang, Wen-Ching Wu | 2005-09-27 |