JS

Jon C. Sandberg

RE Research Electro-Optics: 9 patents #1 of 10Top 10%
PS Particle Measuring Systems: 5 patents #13 of 64Top 25%
Overall (All Time): #353,053 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8427642 Two-dimensional optical imaging methods and systems for particle detection John R. Mitchell, Dwight A. Sehler, Michael Williamson, David Rice 2013-04-23
8174697 Non-orthogonal particle detection systems and methods John R. Mitchell, Dwight A. Sehler 2012-05-08
8154724 Two-dimensional optical imaging methods and systems for particle detection John R. Mitchell, Dwight A. Sehler, Michael Williamson, David Rice 2012-04-10
8027035 Non-orthogonal particle detection systems and methods John R. Mitchell, Dwight A. Sehler 2011-09-27
7916293 Non-orthogonal particle detection systems and methods John R. Mitchell, Dwight A. Sehler 2011-03-29
7295585 Method for noise cancellation by spectral flattening of laser output in a multi-line-laser instrument Quentin A. Turchette 2007-11-13
7079243 Method of noise cancellation in an unpolarized-laser instrument Quentin A. Turchette 2006-07-18
7023620 Beam array pitch controller James Thompson 2006-04-04
6567456 Method and apparatus for achieving polarization in a laser using a dual-mirror mirror mount 2003-05-20
6379984 High-precision etalon device and method of construction Ramin Lalezari 2002-04-30
5920388 Small particle characteristic determination Nelson C. Turner, Richard C. Gallant 1999-07-06
5907575 Apparatus and method for minimizing performance degradation in a laser device 1999-05-25
5889589 Intracavity particle detection using optically pumped laser media 1999-03-30
5726753 Intracavity particle detection using optically pumped laser media 1998-03-10