Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8895324 | Method of determining an amount of impurities that a contaminating material contributes to high purity silicon | Dennis DePesa, Troy Houthoofd, Alan Rytlewski | 2014-11-25 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8895324 | Method of determining an amount of impurities that a contaminating material contributes to high purity silicon | Dennis DePesa, Troy Houthoofd, Alan Rytlewski | 2014-11-25 |