AR

Alan Rytlewski

HS Hemlock Semiconductor: 1 patents #17 of 50Top 35%
Overall (All Time): #3,136,234 of 4,157,543Top 80%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8895324 Method of determining an amount of impurities that a contaminating material contributes to high purity silicon Dennis DePesa, Jon Host, Troy Houthoofd 2014-11-25