JG

John H. Givens

Micron: 48 patents #378 of 6,345Top 6%
IBM: 4 patents #21,733 of 70,183Top 35%
UA US Army: 1 patents #2,720 of 6,974Top 40%
Overall (All Time): #47,863 of 4,157,543Top 2%
54
Patents All Time

Issued Patents All Time

Showing 25 most recent of 54 patents

Patent #TitleCo-InventorsDate
7510961 Utilization of energy absorbing layer to improve metal flow and fill in a novel interconnect structure 2009-03-31
6984874 Semiconductor device with metal fill by treatment of mobility layers including forming a refractory metal nitride using TMEDT Russell C. Zahorik, Brenda D. Kraus 2006-01-10
6812139 Method for metal fill by treatment of mobility layers Russell C. Zahorik, Brenda D. Kraus 2004-11-02
6790764 Processing methods for providing metal-comprising materials within high aspect ratio openings 2004-09-14
6787447 Semiconductor processing methods of forming integrated circuitry 2004-09-07
6787472 Utilization of disappearing silicon hard mask for fabrication of semiconductor structures Mark E. Jost 2004-09-07
6784550 Thermal processing of metal alloys for an improved CMP process in integrated circuit fabrication Paul A. Farrar 2004-08-31
6781235 Three-level unitary interconnect structure 2004-08-24
6774035 Thermal processing of metal alloys for an improved CMP process in integrated circuit fabrication Paul A. Farrar 2004-08-10
6689693 Methods for utilization of disappearing silicon hard mask for fabrication of semiconductor structures Mark E. Jost 2004-02-10
6548883 Reduced RC between adjacent substrate wiring lines 2003-04-15
6537903 Processing methods for providing metal-comprising materials within high aspect ratio openings 2003-03-25
6534408 Utilization of disappearing silicon hard mask for fabrication of semiconductor structures Mark E. Jost 2003-03-18
6482735 Method for improved metal fill by treatment of mobility layers Russell C. Zahorik, Brenda D. Kraus 2002-11-19
6461963 Utilization of disappearing silicon hard mask for fabrication of semiconductor structures Mark E. Jost 2002-10-08
6404053 Utilization of energy absorbing layer to improve metal flow and fill in a novel interconnect structure 2002-06-11
6396119 Reduced RC delay between adjacent substrate wiring lines 2002-05-28
6320261 High aspect ratio metallization structures for shallow junction devices, and methods of forming the same Randle D. Burton 2001-11-20
6319813 Semiconductor processing methods of forming integrated circuitry and integrated circuitry constructions 2001-11-20
6316360 High aspect ratio metallization structures for shallow junction devices, and methods of forming the same Randle D. Burton 2001-11-13
6316356 Thermal processing of metal alloys for an improved CMP process in integrated circuit fabrication Paul A. Farrar 2001-11-13
6309946 Reduced RC delay between adjacent substrate wiring lines 2001-10-30
6297156 Method for enhanced filling of high aspect ratio dual damascene structures Paul A. Farrar 2001-10-02
6274253 Processing methods for providing metal-comprising materials within high aspect ratio openings 2001-08-14
6271593 Method for fabricating conductive components in microelectronic devices and substrate structures therefor Richard H. Lane 2001-08-07