Issued Patents All Time
Showing 1–25 of 67 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12375815 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks +1 more | 2025-07-29 |
| 12284445 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks +5 more | 2025-04-22 |
| 12130858 | Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks +2 more | 2024-10-29 |
| 12010430 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks +1 more | 2024-06-11 |
| 11902665 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks +5 more | 2024-02-13 |
| 11869744 | Electron microscope sample holder fluid handling with independent pressure and flow control | Franklin Stampley Walden, II, Daniel Stephen Gardiner, William Bradford Carpenter | 2024-01-09 |
| 11755639 | Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks +2 more | 2023-09-12 |
| 11514586 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks +5 more | 2022-11-29 |
| 11477388 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks +1 more | 2022-10-18 |
| 11476083 | Electrical devices with edge slits for mounting sample | Hessam Ghassemi, Ian Patrick Wellenius, Rémy Berthier | 2022-10-18 |
| 11455333 | Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks +2 more | 2022-09-27 |
| 11399138 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks +1 more | 2022-07-26 |
| 11222765 | Electron microscope sample holder fluid handling with independent pressure and flow control | Franklin Stampley Walden, II, Daniel Stephen Gardiner, William Bradford Carpenter | 2022-01-11 |
| 11170968 | MEMS frame heating platform for electron imagable fluid reservoirs or larger conductive samples | Franklin Stampley Walden, II, Daniel Stephen Gardiner, David P. Nackashi, William Bradford Carpenter | 2021-11-09 |
| 10986279 | Automated application of drift correction to sample studied under electron microscope | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner, Mark Uebel, Alan Philip Franks +1 more | 2021-04-20 |
| 10777380 | MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples | Franklin Stampley Walden, II, Daniel Stephen Gardiner, David P. Nackashi, William Bradford Carpenter | 2020-09-15 |
| RE48201 | Specimen holder used for mounting samples in electron microscopes | David P. Nackashi, Stephen E. Mick, Thomas G. Schmelzer, Michael Zapata, III | 2020-09-08 |
| 10586679 | Method for enabling modular part replacement within an electron microscope sample holder | Daniel Stephen Gardiner, Franklin Stampley Walden, II | 2020-03-10 |
| 10503127 | Method for safe control of gas delivery to an electron microscope sample holder | Daniel Stephen Gardiner, David P. Nackashi, William Bradford Carpenter, James Robert Rivenbark, Jr., Mark Uebel +3 more | 2019-12-10 |
| 10460906 | Method for monitoring environmental states of a microscope sample with an electron microscope sample holder | Daniel Stephen Gardiner, William Bradford Carpenter, Franklin Stampley Walden, II, David P. Nackashi | 2019-10-29 |
| 10446363 | MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples | Franklin Stampley Walden, II, Daniel Stephen Gardiner, David P. Nackashi, William Bradford Carpenter | 2019-10-15 |
| 10373800 | Method for optimizing fluid flow across a sample within an electron microscope sample holder | Daniel Stephen Gardiner, Franklin Stampley Walden, II | 2019-08-06 |
| 10256563 | Method for forming an electrical connection to a sample support in an electron microscope holder | David P. Nackashi, Daniel Stephen Gardiner, Franklin Stampley Walden, II, William Bradford Carpenter | 2019-04-09 |
| D841183 | Window E-chip for an electron microscope | Franklin Stampley Walden, II, David P. Nackashi, Daniel Stephen Gardiner | 2019-02-19 |
| 10192714 | Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices | David P. Nackashi, Stephen E. Mick | 2019-01-29 |