Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11579096 | Wafer inspection apparatus and method | Sungha Kim, Doohyun Cho, Kwangsung Lee, Jongsu Kim, Taejoong Kim +1 more | 2023-02-14 |
HK
Hyounggon Kim
Overall (All Time): #2,567,417 of 4,157,543Top 65%
1
Patents All Time