Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6283134 | Apparatus for removing photo-resist | Army Chung, Chi-Fa Ku | 2001-09-04 |
| 6153360 | Method of removing photo-resist | Army Chung, Chi-Fa Ku | 2000-11-28 |
| 5637186 | Method and monitor testsite pattern for measuring critical dimension openings | Chih-Chiang Liu, Po-Wen Yen | 1997-06-10 |