Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10018668 | Kill die subroutine at probe for reducing parametric failing devices at package test | Soh Ying Seah | 2018-07-10 |
| 9772372 | Kill die subroutine at probe for reducing parametric failing devices at package test | Soh Ying Seah | 2017-09-26 |