Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6975002 | SOI single crystalline chip structure | Ray Chien | 2005-12-13 |
| 6051984 | Wafer-level method of hot-carrier reliability test for semiconductor wafers | Jiuun-Jer Yang | 2000-04-18 |