Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10705028 | Method of inspecting foreign substance on substrate | Hyun Seok Lee, Jae-Sik Yang, Ja-Geun Kim, Hee-Tae Kim | 2020-07-07 |
| 10468415 | Semiconductor device and semiconductor package including the same | Won Chul Lee | 2019-11-05 |
| 10060859 | Method of inspecting foreign substance on substrate | Hyun Seok Lee, Jae-Sik Yang, Ja-Geun Kim, Hee-Tae Kim | 2018-08-28 |
| 9885669 | Method of inspecting a substrate | Soo Young Cho, Bong-Ha Hwang, Hee-Tae Kim | 2018-02-06 |
| 9256912 | Method of measuring measurement target | Joong-Ki Jeong, Min Young Kim | 2016-02-09 |
| 9124810 | Method of checking an inspection apparatus and method of establishing a measurement variable of the inspection apparatus | — | 2015-09-01 |
| 8878929 | Three dimensional shape measurement apparatus and method | Ho KIM, Kwang-Ill Kho, Jae Myeong Song | 2014-11-04 |
| 8644590 | Method of measuring measurement target | Joong-Ki Jeong, Min Young Kim | 2014-02-04 |
| 8116555 | Vision inspection system and method for inspecting workpiece using the same | Woo Jung Ahn, Jung-Hwan Kim | 2012-02-14 |