Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8327205 | IC testing methods and apparatus | Tom Waayers, Johan C. Meirlevede, David Price, Norbert Schomann, Ruediger Solbach +1 more | 2012-12-04 |
| 7960189 | Method of manufacturing a system in package | Philippe Cauvet, Fabrice Verjus | 2011-06-14 |
| 7899641 | Testable electronic circuit | Jean-Marc Yannou | 2011-03-01 |
| 7519496 | Electronic circuit comprising a secret sub-module | Jean-Marc Yannou, Herve Vincent | 2009-04-14 |
| 7124340 | Low pin count, high-speed boundary scan testing | Gerardus A. A. Bos, Hendrikus Petrus Elisabeth Vranken, Thomas Waayers, David Lelouvier | 2006-10-17 |