Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12249115 | Large scale computational lithography using machine learning models | Dereje Shewaseged Woldeamanual, Thomas Mulders, Jiuzhou Tang, Rainer Zimmermann, Robert M. Lugg +1 more | 2025-03-11 |
| 11914306 | Predicting defect rate based on lithographic model parameters | Erik Verduijn, Ulrich Klostermann, Ulrich Welling, Jiuzhou Tang | 2024-02-27 |
| 11640490 | Source mask optimization by process defects prediction | William A. Stanton, Sylvain Berthiaume | 2023-05-02 |