HN

Han-jik Nam

Samsung: 1 patents #49,284 of 75,807Top 70%
📍 Seoul, KR: #24,369 of 39,741 inventorsTop 65%
Overall (All Time): #2,739,245 of 4,157,543Top 70%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11067658 Probe card inspection wafer, probe card inspection system, and method of inspecting probe card Joon-Su Ji, Dany Kim, Jin Woo Jung 2021-07-20