HB

Hans-Detlef Brust

SA Siemens Aktiengesellschaft: 16 patents #490 of 22,248Top 3%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
📍 Sulzbach/Saar, DE: #1 of 25 inventorsTop 4%
Overall (All Time): #186,682 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDate
6650999 Method and device for finding a parked vehicle Mehmet Ali Kilcioglu 2003-11-18
5424961 "Process and system for measuring the temporal course of a periodic signal having high time resolution according to a ""Boxcar-like"" process" 1995-06-13
5281909 Process and system for measuring the course of a signal at a point of measurement on a sample 1994-01-25
5260648 Process and system for rapid analysis of the spectrum of a signal at one or several points of measuring 1993-11-09
5185571 Process and system for the asynchronous measurement of signal courses 1993-02-09
4972142 Automatic frequency follow-up in particle beam metrology upon employment of a modulated primary beam 1990-11-20
4967150 Method and apparatus for phase measurement of signals at a measuring point by an unmodulated particle beam 1990-10-30
4954773 Voltage measurement with an electron probe without external trigger signal 1990-09-04
4902963 Method and arrangement for recording periodic signals with a laser probe 1990-02-20
4902966 Method and apparatus for operating a scanning microscope Johann Otto 1990-02-20
4887031 Method and apparatus for detecting and imaging measuring points that have a defined signal progression 1989-12-12
4853622 Method and apparatus for detecting and imaging a voltage signal of at least one specific frequency at a measuring location 1989-08-01
4831328 Measurement processing arrangement 1989-05-16
4820977 Method and apparatus for identifying points on a specimen having a defined time-dependent signal 1989-04-11
4812748 Method and apparatus for operating a scanning microscope Johann Otto 1989-03-14
4803357 Method and arrangement for detecting secondary particles triggered on a specimen by a primary particle beam 1989-02-07
4780669 Method and arrangement for evaluating a test voltage by means of a bandwidth-limited evaluation circuit Johann Otto 1988-10-25
4771235 Method and apparatus for detecting and imaging measuring points that have a defined signal progression 1988-09-13
4752686 Method and apparatus for emphasizing a specimen surface region scanned by a scanning microscope primary beam 1988-06-21
4745362 Method and apparatus for detecting and imaging a voltage signal of at least one specific frequency at a measuring location 1988-05-17
4689555 Method for the determination of points on a specimen carrying a specific signal frequency by use of a scanning microscope Johann Otto 1987-08-25
4678988 Method and apparatus for spectral analysis of a signal at a measuring point 1987-07-07
4677351 Circuit for preventing burn-in spots on the picture screen of a visual display Johann Otto 1987-06-30