Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8145958 | Integrated circuit and method for testing memory on the integrated circuit | Robert Campbell Aitken | 2012-03-27 |
| 8112681 | Method and apparatus for handling fuse data for repairing faulty elements within an IC | Faisal Ramzan Ali Khoja, Sauro Landini, Ramamurti Chandramouli | 2012-02-07 |
| 8045401 | Supporting scan functions within memories | Yew Keong Chong, Gus Yeung, Paul Darren Hoxey, Paul Stanley Hughes | 2011-10-25 |
| 7734974 | Serial scan chain control within an integrated circuit | Robert Campbell Aitken, Dipesh Ishwerbhai Patel | 2010-06-08 |