| 12334170 |
Operating and testing semiconductor devices |
Taewook Park, Jisu Kang, Yongki Lee |
2025-06-17 |
| 12164376 |
Storage device including mapping memory and method of operating the same |
Taewook Park, Jisu Kang, Yongki Lee |
2024-12-10 |
| 11867757 |
Built-in self-test circuits and semiconductor integrated circuits including the same |
Heejune Lee, Jinwoo Park, Younghyo Park, Sungno Lee, Youngjae Cho +1 more |
2024-01-09 |
| 11804276 |
Built-in-self-test logic, memory device with same, and memory module testing method |
Jaehyeok Kim, Yong Ki Lee, Gapkyoung Kim, Taewook Park |
2023-10-31 |
| 11698410 |
Semiconductor integrated circuit and method of testing the same |
Hyochul Shin, Jinwoo Park, Sungno Lee, Younghyo Park, Yongki Lee +3 more |
2023-07-11 |
| 11698852 |
Apparatus and method for writing data in a memory |
Jaeshin Lee, Jaechul Park |
2023-07-11 |
