Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11804276 | Built-in-self-test logic, memory device with same, and memory module testing method | Eunhye Oh, Jaehyeok Kim, Yong Ki Lee, Taewook Park | 2023-10-31 |
GK
Gapkyoung Kim
Overall (All Time): #2,617,403 of 4,157,543Top 65%
1
Patents All Time