Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11340343 | Apparatus and methods for thickness and velocity measurement of flat moving materials using high frequency radar technologies | Alexander M. Raykhman, Boris Sherman | 2022-05-24 |
| 8174258 | Method and system for measurement of parameters of a flat material | Alexander M. Raykhman, Eugene Naidis | 2012-05-08 |