Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6128754 | Tester having event generation circuit for acquiring waveform by supplying strobe events for waveform acquisition rather than using strobe events specified by the test program | Burnell G. West | 2000-10-03 |
| 6014764 | Providing test vectors with pattern chaining definition | Burnell G. West, Teck Chiau Chew | 2000-01-11 |
| 5673275 | Accelerated mode tester timing | Rodolfo Garcia | 1997-09-30 |
| 5481550 | Apparatus for maintaining stimulation to a device under test after a test stops | Rodolfo Garcia | 1996-01-02 |
| 5477139 | Event sequencer for automatic test equipment | Burnell G. West | 1995-12-19 |
| 5461310 | Automatic test equipment system using pin slice architecture | David K. Cheung | 1995-10-24 |
| 5225772 | Automatic test equipment system using pin slice architecture | David K. Cheung | 1993-07-06 |
| 5212443 | Event sequencer for automatic test equipment | Burnell G. West | 1993-05-18 |
| 5122988 | Data stream smoothing using a FIFO memory | — | 1992-06-16 |