Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11969276 | Dual head X-ray inspection system | Kiyoshi Ogata, Avishai Shklar, Ofek Oiknine | 2024-04-30 |
| 10697907 | Metrology measuring apparatus | Michael Geffen, Roni Peretz, Colin Smith | 2020-06-30 |
| 10697908 | Metrology inspection apparatus | Michael Geffen, Roni Peretz, Colin Smith | 2020-06-30 |
| 9335283 | Method and a system for recognizing voids in a bump | Micha Geffen | 2016-05-10 |