Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10697907 | Metrology measuring apparatus | Doron Reinis, Roni Peretz, Colin Smith | 2020-06-30 |
| 10697908 | Metrology inspection apparatus | Doron Reinis, Roni Peretz, Colin Smith | 2020-06-30 |
| 6934019 | Confocal wafer-inspection system | Yaki Levi | 2005-08-23 |
| 6192289 | Method and apparatus for analyzing cuts | Abraham Ben-Har | 2001-02-20 |