Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7920165 | Video training system | — | 2011-04-05 |
| 7204131 | Dynamic activation for an atomic force microscope and method of use thereof | Stephen C. Minne | 2007-04-17 |
| 7036357 | Dynamic activation for an atomic force microscope and method of use thereof | Stephen C. Minne | 2006-05-02 |
| 7017398 | Active probe for an atomic force microscope and method for use thereof | Stephen C. Minne | 2006-03-28 |
| 6951143 | Three-axis sensor assembly for use in an elastomeric material | Stephen C. Minne | 2005-10-04 |
| 6941823 | Apparatus and method to compensate for stress in a microcantilever | Jonathan W. Lai, Hector Cavazos, Stephen C. Minne | 2005-09-13 |
| 6810720 | Active probe for an atomic force microscope and method of use thereof | Stephen C. Minne | 2004-11-02 |
| 6672144 | Dynamic activation for an atomic force microscope and method of use thereof | Stephen C. Minne | 2004-01-06 |
| 6637276 | Tire sensor and method | Stephen C. Minne | 2003-10-28 |
| 6530266 | Active probe for an atomic force microscope and method of use thereof | Stephen C. Minne | 2003-03-11 |
| 6279389 | AFM with referenced or differential height measurement | Stephen C. Minne | 2001-08-28 |
| 6196061 | AFM with referenced or differential height measurement | Stephen C. Minne | 2001-03-06 |
| 6189374 | Active probe for an atomic force microscope and method of use thereof | Stephen C. Minne | 2001-02-20 |
| 6172506 | Capacitance atomic force microscopes and methods of operating such microscopes | Virgil B. Elings | 2001-01-09 |
| 5874734 | Atomic force microscope for measuring properties of dielectric and insulating layers | Virgil B. Elings, Dror Sarid | 1999-02-23 |