Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10620236 | Multi-test type probe card and corresponding testing system for parallel testing of dies via multiple test sites | Michael Gonia, Scott Wu, Marc Jacobs | 2020-04-14 |
| 9244107 | Heat sink blade pack for device under test testing | Bruce Tirado, Scott Wu, William Su, Robert P. Zaldain, Reid T. Hirata +1 more | 2016-01-26 |
| 5700045 | Universal QFP tray transfer method | Gary L. Small | 1997-12-23 |
| 5537031 | Integrated circuit test jig | Arno G. Marcuse | 1996-07-16 |
| 5124644 | System for positioning a semiconductor chip package with respect to a testing device | — | 1992-06-23 |
| 5110628 | Method and apparatus for marking or erasing a marking on a semiconductor chip package | Gary L. Small | 1992-05-05 |