Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10620236 | Multi-test type probe card and corresponding testing system for parallel testing of dies via multiple test sites | David Ganapol, Scott Wu, Marc Jacobs | 2020-04-14 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10620236 | Multi-test type probe card and corresponding testing system for parallel testing of dies via multiple test sites | David Ganapol, Scott Wu, Marc Jacobs | 2020-04-14 |