Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9791849 | Defect detection process in a semiconductor manufacturing environment | Matthew J. Hartnett, Keith A. Robishaw, Glenn M. Stefanski | 2017-10-17 |
DC
David F. Cutilli
Overall (All Time): #2,969,996 of 4,157,543Top 75%
1
Patents All Time