Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7607057 | Test wrapper including integrated scan chain for testing embedded hard macro in an integrated circuit chip | Mark Boike, Seshagiri Prasad Kalluri, Vijayanand Angarai, Scott A. Beeker | 2009-10-20 |