Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7607057 | Test wrapper including integrated scan chain for testing embedded hard macro in an integrated circuit chip | Mark Boike, Seshagiri Prasad Kalluri, Vijayanand Angarai, David Mark Brantley | 2009-10-20 |
| 6530044 | System and disassembling test data and method | Cornelius J. Falvey, Mark P. Mullally | 2003-03-04 |
| 6321347 | Network testing system and method | Cornelius J. Falvey, Mark P. Mullally | 2001-11-20 |
| 6219802 | System for generating test data | Cornelius J. Falvey, Mark P. Mullally | 2001-04-17 |