DB

David H. Bothell

QM Quest Metrology: 4 patents #3 of 7Top 45%
QI Quest Integrated: 1 patents #9 of 15Top 60%
Overall (All Time): #986,953 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10036629 Optical thread profiler Phillip Dewayne Bondurant, David William Rook, Christian Robert Lentz, David Jack Savage 2018-07-31
9638517 Optical thread profiler Phillip Dewayne Bondurant, David William Rook, Christian Robert Lentz, David Jack Savage 2017-05-02
9385448 Electrical connection via fastener hole Phillip Dewayne Bondurant, Giovanni Nino, David William Rook, Anthony Mactutis 2016-07-05
9234748 Optical thread profiler Phillip Dewayne Bondurant, David William Rook, Christian Robert Lentz, David Jack Savage 2016-01-12
8860952 Optical thread profiler Phillip Dewayne Bondurant, David William Rook, Christian Robert Lentz, David Jack Savage 2014-10-14