DS

David Jack Savage

QM Quest Metrology: 4 patents #3 of 7Top 45%
Overall (All Time): #1,187,410 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
10036629 Optical thread profiler Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz 2018-07-31
9638517 Optical thread profiler Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz 2017-05-02
9234748 Optical thread profiler Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz 2016-01-12
8860952 Optical thread profiler Phillip Dewayne Bondurant, David William Rook, David H. Bothell, Christian Robert Lentz 2014-10-14