| 11047795 |
Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems |
Kazuki Negishi, Michael E. Simmons, Joseph George Frankel, Eric Robert Christenson, Mario Berg |
2021-06-29 |
| 10698002 |
Probe systems for testing a device under test |
Michael E. Simmons, Bryan Bolt, Gavin Neil Fisher, Anthony Lord, Kazuki Negishi |
2020-06-30 |
| 10060950 |
Shielded probe systems |
Michael E. Simmons, Bryan Bolt, Kazuki Negishi, Joseph George Frankel, Robbie Ingram-Goble |
2018-08-28 |
| 9991152 |
Wafer-handling end effectors with wafer-contacting surfaces and sealing structures |
Robbie Ingram-Goble, Michael E. Simmons, Philip Wolf, Ryan Garrison |
2018-06-05 |
| 8167648 |
Low noise connector with cables having a center, middle and outer conductors |
Kazuki Negishi, Michael E. Simmons, ToeNaing Swe |
2012-05-01 |