CR

Christopher Raymond

NI Nanometrics Incorporated: 3 patents #30 of 127Top 25%
Overall (All Time): #1,235,954 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8330946 Silicon filter for photoluminescence metrology Andrzej Buczkowski 2012-12-11
7639371 Line profile asymmetry measurement 2009-12-29
7515279 Line profile asymmetry measurement 2009-04-07
5773769 Twin lever key with horizontal finger pads for code transmission 1998-06-30