Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9542266 | Semiconductor integrated circuit and method of processing in semiconductor integrated circuit | Yutaka Sekino, Yoshiki Okumura, Hiroaki Watanabe, Naoki Maezawa, Hideyuki Negi | 2017-01-10 |
| 8855242 | Data receiving circuit, information processing apparatus, a computer readable storage medium, and data receiving method | Hiroaki Watanabe, Hideyuki Negi, Yutaka Sekino | 2014-10-07 |
| 8503259 | Memory test method and memory test device | Shogo Shibazaki, Shinkichi Gama, Hideyuki Negi, Takeshi Nagase, Yutaka Sekino | 2013-08-06 |
| 8436644 | Configuration method and FPGA circuit re-executing configuration based on adjusted configuration data | Hiroaki Watanabe, Naoki Maezawa | 2013-05-07 |
| 8143901 | Test apparatus, test method, and integrated circuit | Yutaka Sekino, Shogo Shibazaki, Shinkichi Gama, Takeshi Nagase, Hideyuki Negi | 2012-03-27 |
| 7158638 | Encryption circuit | Souichi Okada, Naoya Torii, Tomohiro Hayashi, Yumi Fujiwara | 2007-01-02 |
| 5648975 | Method and device for generating test patterns for testing integrated circuit | — | 1997-07-15 |